Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1987-04-06
1988-09-27
Dees, Jose G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430323, 430324, 430330, 156643, 156646, 1566571, G03C 500
Patent
active
047741643
ABSTRACT:
Patterning a chrome mask with PBS (polybutenesulfone) photoresist is enabled in a plasma reactor by covering the patterned photoresist with a glass layer, planarizing the glass layer, etching the photoresist and then etching the chrome mask. The pattern transferred to the chrome mask is the negative or inverse of the pattern in the photoresist layer.
REFERENCES:
patent: 3567447 (1971-03-01), Chand
patent: 4489146 (1984-12-01), Bock et al.
patent: 4634645 (1987-01-01), Matsuda et al.
Peavey Jerris H.
Peavey Paula E.
Dees Jos,e G.
Tegal Corporation
Wille Paul F.
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