Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1987-11-23
1989-06-06
Lacey, David L.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156646, 156656, 1566591, 156664, 252 791, C23F 102, C23F 112
Patent
active
048368873
ABSTRACT:
A plasma comprised of a fluorinated gas, an oxidant, and up to 15%-20% chlorofluorocarbon gas etches non-insulating materials such as tungsten and silicon at very high etch rates while providing enhanced etch rate ratios to photoresist and insulators.
REFERENCES:
patent: 30505 (1981-02-01), Jacob
patent: 31813 (1980-10-01), Cote et al.
patent: 123639 (1982-03-01), Daubenspeck
patent: 3923568 (1975-12-01), Bersin
patent: 3951709 (1976-04-01), Jacob
patent: 4026742 (1977-05-01), Fujino
patent: 4267013 (1981-05-01), Iida et al.
patent: 4374698 (1983-02-01), Sanders et al.
patent: 4374699 (1988-02-01), Sanders et al.
patent: 4447290 (1984-05-01), Matthews
patent: 4475982 (1984-10-01), Lai et al.
patent: 4547261 (1985-10-01), Maa et al.
patent: 4713141 (1987-12-01), Tsang
patent: 4726879 (1988-02-01), Bondur et al.
Saia et al., "Reactive Ion Etching of Refractory Metals For Gate and Interconnect Applications", Materials Research Soc. 1987.
"Blanket CVD Tungsten Interconnect for VLSI Devices," S. Mehta et al., 1986 Proceedings 3rd International IEEE VLSI Multilevel Interconnection Conf., Santa Clara, CA., Jun. 9-10 1986, pp. 418-435.
"Selective Dry Etching of Tungsten for VLSI Metallization," Journal of the Electrochemical Society: Solid-State Science and Technology, Oct. 1986, pp. 2113-2118.
"RF Sputter-Etching by Fluoro-Chloro-Hydrocarbon Gases," N. Hosokawa et al., Japan J. Appl. Phys., Suppl. 2, Pt. 1, 1974, p. 435.
Daubenspeck Timothy H.
Ichishita Faith S.
Anderson Andrew J.
Chadurjian Mark F.
International Business Machines - Corporation
Lacey David L.
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