Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With electrical contact in hole in semiconductor
Reexamination Certificate
2008-07-10
2011-10-18
Lee, Eugene (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Physical configuration of semiconductor
With electrical contact in hole in semiconductor
C257S686000, C257S777000, C257SE23169, C257SE25006, C257SE25013, C257SE25021
Reexamination Certificate
active
08039928
ABSTRACT:
A chip stack package includes a plurality of chips that are stacked by using adhesive layers as intermediary media, and a through via electrode formed through the chips to electrically couple the chips. The through via electrode is classified as a power supply through via electrode, a ground through via electrode, or a signal transfer through via electrode. The power supply through via electrode and the ground through via electrode are formed of a first material such as copper, and the signal transfer through via electrode is formed of second material such as polycrystalline silicon doped with impurities. The signal transfer through via electrode may have a diametrically smaller cross section than that of each of the power supply through via electrode and the ground through via electrode regardless of their resistivities.
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English language abstract of Japanese Publication No. 2004-134679.
English language abstract of Japanese Publication No. 2004-152810.
English language abstract of Japanese Publication No. 2006-173388.
Baek Seung-Duk
Kang Sun-Won
Lee Jong-Joo
Gumedzoe Peniel M
Lee Eugene
Muir Patent Consulting, PLLC
Samsung Electronics Co,. Ltd.
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