4. Electricity: measuring and testing
  5. Measuring, testing, or sensing electricity, per se
  6. With rotor

Jin H. Yoon

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Chip-lifetime testing instrument for semiconductor devices

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Semiconductor chip contact bump structure

Electricity: conductors and insulators – Conduits – cables or conductors – Preformed panel circuit arrangement
Patent

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Semiconductor package

Electricity: conductors and insulators – Boxes and housings – Hermetic sealed envelope type
Patent

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Video signal compensating circuit of a TV/VCR

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent

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Profile ID: LFUS-PAI-P-810055

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