Charged particle beam microscope with minicolumn

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

Reexamination Certificate

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Details

C250S310000, C250S311000, C250S398000, C250S42300F

Reexamination Certificate

active

07075092

ABSTRACT:
One embodiment of the present invention is an electron microscope that includes: (a) a main vacuum chamber housing a stage therein and connected to a vacuum pump; (b) a load lock for loading a specimen into said main vacuum chamber; (c) a minicolumn non-translatably positioned inside said main chamber; and (d) a vacuum pump situated inside the main vacuum chamber and external to and connected to the minicolumn.

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