Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Reexamination Certificate
2006-07-11
2006-07-11
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Analyte supports
C250S310000, C250S311000, C250S398000, C250S42300F
Reexamination Certificate
active
07075092
ABSTRACT:
One embodiment of the present invention is an electron microscope that includes: (a) a main vacuum chamber housing a stage therein and connected to a vacuum pump; (b) a load lock for loading a specimen into said main vacuum chamber; (c) a minicolumn non-translatably positioned inside said main chamber; and (d) a vacuum pump situated inside the main vacuum chamber and external to and connected to the minicolumn.
REFERENCES:
patent: 3881125 (1975-04-01), Baker et al.
patent: 4058731 (1977-11-01), Müller et al.
patent: 4420686 (1983-12-01), Onoguchi et al.
patent: 4467211 (1984-08-01), Smith et al.
patent: 4706019 (1987-11-01), Richardson
patent: 4725736 (1988-02-01), Crewe
patent: 4760567 (1988-07-01), Crewe
patent: 4764818 (1988-08-01), Crew
patent: 4817053 (1989-03-01), Ikeda et al.
patent: 4851768 (1989-07-01), Yoshizawa et al.
patent: 4864228 (1989-09-01), Richardson
patent: 4939364 (1990-07-01), Ishitani et al.
patent: 4954711 (1990-09-01), Fink et al.
patent: 4963823 (1990-10-01), Otto et al.
patent: 4974736 (1990-12-01), Okunuki et al.
patent: 5093572 (1992-03-01), Hosono
patent: 5122663 (1992-06-01), Chang et al.
patent: 5155412 (1992-10-01), Chang et al.
patent: 5229607 (1993-07-01), Matsui et al.
patent: 5270990 (1993-12-01), Mizasawa et al.
patent: 5319198 (1994-06-01), Wada
patent: 5329125 (1994-07-01), Feuerbaum
patent: 5376792 (1994-12-01), Schamber et al.
patent: 5399860 (1995-03-01), Miyoshi et al.
patent: 5401974 (1995-03-01), Oae et al.
patent: 5420433 (1995-05-01), Oae et al.
patent: 5442183 (1995-08-01), Matsui et al.
patent: 5502306 (1996-03-01), Meisburger et al.
patent: 5546337 (1996-08-01), Hurt et al.
patent: 5587586 (1996-12-01), Kruit
patent: 5734164 (1998-03-01), Sanford
patent: 5786601 (1998-07-01), Sturrock et al.
patent: 5811803 (1998-09-01), Komatsu et al.
patent: 5831272 (1998-11-01), Utsumi
patent: 5869833 (1999-02-01), Richardson et al.
patent: 5912096 (1999-06-01), Hada
patent: 5933211 (1999-08-01), Nakasugi et al.
patent: 5981962 (1999-11-01), Groves et al.
patent: 6057553 (2000-05-01), Khursheed et al.
patent: 6091249 (2000-07-01), Talbot et al.
patent: 6114681 (2000-09-01), Komatsu
patent: 6252412 (2001-06-01), Talbot et al.
patent: 6452174 (2002-09-01), Hirose et al.
patent: 6504393 (2003-01-01), Lo et al.
patent: 6522776 (2003-02-01), Ehrichs
patent: 6740889 (2004-05-01), Winkler et al.
patent: 5128988 (1991-10-01), None
patent: 11260298 (1999-09-01), None
“Novel high brightness miniature electron gun for high current e-beam applications,” F. Burstert et al.Microelectronic Engineering, 31 (1996) 95-100.
“Electron beam technology—SEM to microcolumn,” T.H.P. Chang et al.,Microelectronic Engineering, 32 (1996) 113-130.
“Miniature electrostatic lens for generation of low-voltage high current electron probe,” C.-D. Bubeck et al.Proceedings of the Charged Particle Optics Conference, Apr. 14-17, 1998, pp. 1-9.
Bach Joseph
Feuerbaum Hans-Peter
Winkler Dieter
Applied Materials Inc.
McDermott & Will & Emery
LandOfFree
Charged particle beam microscope with minicolumn does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Charged particle beam microscope with minicolumn, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charged particle beam microscope with minicolumn will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3552979