Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1996-08-26
1999-03-23
McPherson, John A.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430942, G03C 500
Patent
active
058857478
ABSTRACT:
A charged beam lithography method comprising the method steps shown in the Figure below.
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Sohn et al., "Comparative Study on Optical Proximity Effect Correction iwth Various Types of Dummy Patterns and its Application to DRAM Devices", Technical Rpt. of Samsung Elec.
Anze Hirohito
Tamamushi Shuichi
Yamasaki Satoshi
Ashton Rosemary
Kabushiki Kaisha Toshiba
McPherson John A.
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