Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-07-11
2006-07-11
Lee, Eddie (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S315000
Reexamination Certificate
active
07075142
ABSTRACT:
A cell array of a flash memory device includes extended source strapping regions. The cell array includes a device isolation layer and active regions. The device isolation layer is formed in a semiconductor substrate, and the active regions are defined by the device isolation layer. Word lines cross over the active regions, and a common source line electrically connects the active regions between two word lines of word line pairs. A source strapping region is defined between the two word lines of the word line pairs. The source strapping region crosses multiple active regions.
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Notice to Submit a Response/Amendment to the Examination Report for Korean patent application No. 10-2004-0008395 mailed on Sep. 24, 2005
Park Chan-kwang
Sim Sang-pil
Arora Ajay
Lee Eddie
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
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