Carrier mobility enhanced channel devices and method of...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

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C438S589000, C438S926000, C438S299000, C257SE21444

Reexamination Certificate

active

07964487

ABSTRACT:
An integrated circuit with stress enhanced channels, a design structure and a method of manufacturing the integrated circuit is provided. The method includes forming a dummy gate structure on a substrate and forming a trench in the dummy gate structure. The method further includes filling a portion of the trench with a strain inducing material and filling a remaining portion of the trench with gate material.

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PCT/US/ 09/45788, International Search Report and Written Opinion of the International Searching Authority, issued Jul. 21, 2009.

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