Capacitor structures, DRAM cell structures, methods of forming c

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257298, 257301, 257304, 257309, H01L27/108

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active

059052805

ABSTRACT:
The invention includes a construction comprising: a) an opening extending through an insulative layer to a node location; b) a conductive spacer within the opening and narrowing at least a portion of the opening; the conductive spacer having inner and outer surfaces; c) a storage node layer in connecting with the node location and extending along both of the inner and outer surfaces of the conductive spacer, the storage node layer and conductive spacer together forming a capacitor storage node; and d) a dielectric layer and a cell plate layer operatively proximate the storage node.

REFERENCES:
patent: 4845537 (1989-07-01), Nishimura et al.
patent: 4864374 (1989-09-01), Banerjee
patent: 5170233 (1992-12-01), Liu et al.
patent: 5206183 (1993-04-01), Dennison
patent: 5227325 (1993-07-01), Gonzalez
patent: 5229310 (1993-07-01), Sivan
patent: 5229326 (1993-07-01), Dennison et al.
patent: 5244826 (1993-09-01), Gonzalez et al.
patent: 5270968 (1993-12-01), Kim et al.
patent: 5283455 (1994-02-01), Inoue et al.
patent: 5323038 (1994-06-01), Gonzalez et al.
patent: 5334862 (1994-08-01), Manning et al.
patent: 5338700 (1994-08-01), Dennison et al.
patent: 5385858 (1995-01-01), Manabe
patent: 5401681 (1995-03-01), Dennison
patent: 5444013 (1995-08-01), Akram et al.
patent: 5608247 (1997-03-01), Brown
patent: 5612558 (1997-03-01), Harshfield
patent: 5623243 (1997-04-01), Watanabe et al.
Sakao, M., "A Capacitor-Over-Bit-Line (COB) Cell With A Hemispherical-Grain Storage Node For 64Mb DRAMs", 1990 IEEE, pp. 27.3.1-27.3.4.
Aoki, M., et. al., "Fully Self-Aligned 6F.sup.2 Cell Technology For Low Cost 1GbDRAM", 1996 IEEE, pp. 22-23.
IBM Technical Disclosure Bulletin, "Methods of Forming Small Contact Holes", vol. 30, No. 8 (Jan. 1988), pp. 252-253.
Hayden, J.D., et. al., "A New Toroidal TFT Structure For Future Generation SRAMs", IEEE 1993, pp. 825-828, IEDM.

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