Capacitor and method for fabricating the same and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C361S302000, C361S306100, C438S396000, C438S398000

Reexamination Certificate

active

06911365

ABSTRACT:
A capacitor19comprises a lower electrode14formed on a substrate10, an upper electrode18opposed to the lower electrode, and a capacitor dielectric film16formed between the lower electrode and the upper electrode, in which at least one of the lower electrode and the upper electrodes is an electrode of a metal substituted layer. The lower electrodes of polysilicon are formed, and then after the high-temperature heat processing for improving film quality of the capacitor dielectric film has been performed, the lower electrodes of polysilicon is substituted with aluminum to form the lower electrodes of aluminum, whereby aluminum, which cannot withstand the heat processing for improving film quality of the capacitor dielectric film can be used as a material of the lower electrodes. Thus, capacitors having good high-speed response can be formed.

REFERENCES:
patent: 5978207 (1999-11-01), Anderson et al.
patent: 6197634 (2001-03-01), Schuegraf
patent: 6198617 (2001-03-01), Sun
patent: 6344400 (2002-02-01), Yutani
patent: 6552384 (2003-04-01), Murata et al.
patent: 6731494 (2004-05-01), Nakamura
patent: 2002/0056869 (2002-05-01), Morimoto
patent: 2002/0155626 (2002-10-01), Park
patent: 11-97535 (1999-04-01), None
Hiroshi Horie et al.; International Electron Device Meeting, pp. 946-948, 1996.
S. Nakamura et al.; Symposium on VLSI Technology Digest of Technical Papers, 4A-2, pp. 35-36, 1999.

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