Buried strap for trench storage capacitors in dram trench cells

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438246, 438248, 438389, 438392, H01L 218242

Patent

active

059536071

ABSTRACT:
A dynamic random access memory (DRAM) cell is formed with a buried strap which is routed through an isolation trench. This structure frees space in the transfer gate such that the location of the buried strap is not a limiting factor for decreasing the size of DRAM cells.

REFERENCES:
patent: 4801988 (1989-01-01), Kenney
patent: 5360758 (1994-11-01), Bronner et al.
patent: 5389559 (1995-02-01), Hsieh et al.
patent: 5395786 (1995-03-01), Hsu et al.
patent: 5545583 (1996-08-01), Lam et al.
patent: 5576566 (1996-11-01), Kenney et al.
patent: 5627092 (1997-05-01), Alsmeier et al.
patent: 5658816 (1997-08-01), Rajeevakumar
patent: 5692281 (1997-12-01), Rajeevakumar

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Buried strap for trench storage capacitors in dram trench cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Buried strap for trench storage capacitors in dram trench cells, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Buried strap for trench storage capacitors in dram trench cells will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1519675

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.