Bulk nitride mono-crystal including substrate for epitaxy

Active solid-state devices (e.g. – transistors – solid-state diode – Including semiconductor material other than silicon or... – Group iii-v compound

Reexamination Certificate

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C257S001000, C257S009000, C257S010000, C257S011000, C257S189000, C257S200000, C257S222000, C257S289000, C257S627000, C257S628000, C257SE33023, C257S068000

Reexamination Certificate

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11589058

ABSTRACT:
The invention relates to a substrate for epitaxy, especially for preparation of nitride semiconductor layers. Invention covers a bulk nitride mono-crystal characterized in that it is a mono-crystal of gallium nitride and its cross-section in a plane perpendicular to c-axis of hexagonal lattice of gallium nitride has a surface area greater than 100 mm2, it is more than 1,0 μm thick and its C-plane surface dislocation density is less than 106/cm2, while its volume is sufficient to produce at least one further-processable non-polar A-plane or M-plane plate having a surface area at least 100 mm2. More generally, the present invention covers a bulk nitride mono-crystal which is characterized in that it is a mono-crystal of gallium-containing nitride and its cross-section in a plane perpendicular to c-axis of hexagonal lattice of gallium-containing nitride has a surface area greater than 100 mm2, it is more 1,0-μm thick and its surface dislocation density is less than 106/cm2. Mono-crystals according to the present invention are suitable for epitaxial growth of nitride semiconductor layers. Due to their good crystalline quality they are suitable for use in opto-electronics for manufacturing opto-electronic semiconductor devices based on nitrides, in particular for manufacturing semiconductor laser diodes and laser devices. The a.m. bulk mono-crystals of gallium-containing nitride are crystallized on seed crystals. Various seed crystals may be used. The bulk mono-crystals of gallium-containing nitride are crystallized by a method involving dissolution of a gallium-containing feedstock in a supercritical solvent and crystallization of a gallium nitride on a surface of seed crystal, at temperature higher and/or pressure lower than in the dissolution process.

REFERENCES:
patent: 5456204 (1995-10-01), Dimitrov et al.
patent: 5679965 (1997-10-01), Schetzina
patent: 5780876 (1998-07-01), Hata
patent: 5868837 (1999-02-01), DiSalvo et al.
patent: 5928421 (1999-07-01), Yuri et al.
patent: 6031858 (2000-02-01), Hatakoshi et al.
patent: 6046464 (2000-04-01), Schetzina
patent: 6051145 (2000-04-01), Griffith et al.
patent: 6067310 (2000-05-01), Hashimoto et al.
patent: 6139628 (2000-10-01), Yuri et al.
patent: 6156581 (2000-12-01), Vaudo et al.
patent: 6172382 (2001-01-01), Nagahama et al.
patent: 6177057 (2001-01-01), Purdy
patent: 6249534 (2001-06-01), Itoh et al.
patent: 6252261 (2001-06-01), Usui et al.
patent: 6265322 (2001-07-01), Anselm et al.
patent: 6270569 (2001-08-01), Shibata et al.
patent: 6303403 (2001-10-01), Sato et al.
patent: 6329215 (2001-12-01), Porowski et al.
patent: 6372041 (2002-04-01), Cho et al.
patent: 6399500 (2002-06-01), Porowski et al.
patent: 6399966 (2002-06-01), Tsuda et al.
patent: 6423984 (2002-07-01), Kato et al.
patent: 6434053 (2002-08-01), Fujiwara
patent: 6447604 (2002-09-01), Flynn et al.
patent: 6459712 (2002-10-01), Tanaka et al.
patent: 6468882 (2002-10-01), Motoki et al.
patent: 6488767 (2002-12-01), Xu et al.
patent: 6509651 (2003-01-01), Matsubara et al.
patent: 6531072 (2003-03-01), Suda et al.
patent: 6534795 (2003-03-01), Hori et al.
patent: 6586762 (2003-07-01), Kozaki
patent: 6593589 (2003-07-01), Osinski et al.
patent: 6614824 (2003-09-01), Tsuda et al.
patent: 6627552 (2003-09-01), Nishio et al.
patent: 6677619 (2004-01-01), Nagahama et al.
patent: 6686608 (2004-02-01), Takahira
patent: 6711191 (2004-03-01), Kozaki et al.
patent: 6720586 (2004-04-01), Kidoguchi et al.
patent: 6858882 (2005-02-01), Tsuda et al.
patent: 6924512 (2005-08-01), Tsuda et al.
patent: 7057211 (2006-06-01), Dwilinski et al.
patent: 7081162 (2006-07-01), Dwilinski et al.
patent: 7097707 (2006-08-01), Xu
patent: 7160388 (2007-01-01), Dwiliński et al.
patent: 7291544 (2007-11-01), D'Evelyn et al.
patent: 2001/0008656 (2001-07-01), Tischler et al.
patent: 2001/0022154 (2001-09-01), Cho et al.
patent: 2001/0030328 (2001-10-01), Ishida
patent: 2002/0014631 (2002-02-01), Iwata et al.
patent: 2002/0031153 (2002-03-01), Niwa et al.
patent: 2002/0047113 (2002-04-01), Ohno et al.
patent: 2002/0063258 (2002-05-01), Motoki
patent: 2002/0078881 (2002-06-01), Cuomo et al.
patent: 2002/0189531 (2002-12-01), Dwilinski et al.
patent: 2003/0143771 (2003-07-01), Kidoguchi et al.
patent: 2003/0209191 (2003-11-01), Purdy
patent: 2004/0031978 (2004-02-01), D'Evelyn et al.
patent: 2004/0139912 (2004-07-01), Dwilinski et al.
patent: 2004/0244680 (2004-12-01), Dwilinski et al.
patent: 2004/0255840 (2004-12-01), Dwilinski et al.
patent: 2006/0032428 (2006-02-01), Dwilinski et al.
patent: 2006/0037530 (2006-02-01), Dwilinski et al.
patent: 1036414 (1989-10-01), None
patent: 0 716 457 (1996-06-01), None
patent: 0 711 853 (1999-09-01), None
patent: 0 949 731 (1999-10-01), None
patent: 0 973 207 (2000-01-01), None
patent: 1 088 914 (2001-04-01), None
patent: 2 796 657 (2001-01-01), None
patent: 2 326 160 (1998-12-01), None
patent: 2 333 521 (1999-07-01), None
patent: 2-137287 (1990-05-01), None
patent: 7-22692 (1995-03-01), None
patent: 7-165498 (1995-06-01), None
patent: 7-249830 (1995-09-01), None
patent: 8-250802 (1996-09-01), None
patent: 9-134878 (1997-05-01), None
patent: 9-293897 (1997-11-01), None
patent: 10-7496 (1998-01-01), None
patent: 10-70079 (1998-03-01), None
patent: 10-70338 (1998-03-01), None
patent: 10-84161 (1998-03-01), None
patent: 11-54847 (1999-02-01), None
patent: 11-307813 (1999-11-01), None
patent: 2000-82863 (2000-03-01), None
patent: 2000-82867 (2000-03-01), None
patent: 2000-216494 (2000-08-01), None
patent: 2001-85737 (2001-03-01), None
patent: 2001-342100 (2001-12-01), None
patent: 2003-40699 (2003-02-01), None
patent: 2004-168656 (2004-06-01), None
patent: WO 98/55671 (1998-12-01), None
patent: WO 01/24284 (2001-04-01), None
patent: WO 01/24921 (2001-04-01), None
patent: WO 02/101120 (2002-12-01), None
Porowski, S., “High Pressure Growth of GaN—New Prospects for Blue Lasers”, Journal of Crystal Growth, 1996, pp. 583-589, vol. 166, Elsevier Science B.V.
Chu, T. L. et al., “Crystal Growth and Characterization of Gallium Nitride”, J. Electrochem. Soc., Solid-State Science and Technology, Jan. 1974, pp. 159-162, vol. 121, No. 1.
Sakagami, N. et al., “Growth Kinetics and Morphology of ZnO Single Crystal Grown under Hydrothermal Conditions”, Journal of Ceramic Association, 1974, pp. 405-413, vol. 82, No. 8.
Hirano, S. et al., “Hydrothermal Synthesis of Gallium Orothphosphate Crystals”, Bull. Chem. Soc. Japan., 1989, pp. 275-278, vol. 62, The Chemical Society of Japan.
Akasaki, I. et al., “Growth and Properties of Single Crystalline GaN Films by Hydride Vapor Phase Epitaxy”, Crystal Properties and Preparation, 1991, pp. 154-157, vol. 32-34, Trans Tech Publications, Switzerland.
Hirano, S. et al., “Growth of Gallium Orthophosphate Single Crystals in Acidic Hydrothermal Solutions”, Journal of Materials Science, 1991, pp. 2805-2808, vol. 26, Chapman and Hall Ltd.
Laudise, R. A., “What is Materials Chemistry?” Materials for Nonlinear Optics, 1991, pp. 410-433, American Chemical Society.
Porowski, S. et al., “Prospects for High-Pressure Crystal Growth of III-V Nitrides”, Inst. Phys. Conf. Ser., 1993, pp. 369-372, No. 137, Chapter 4, Silicon Carbide and Related Materials.
Pakula, K., et al., “Growth of GaN Metalorganic Chemical Vapour Deposition Layers on GaN Single Crystals”, Acta Physica Polonica A, 1995, pp. 861-864, vol. 88, No. 5.
Dwiliński, R. et al., “On GaN Crystallization by Ammonothermal Method”, ACTA Physica Polonica A, 1996, pp. 763-766, vol. 90, No. 4.
Yanagisawa, K. et al., “Hydrothermal Single Crystal Growth of Calcite in Ammonium Acetate Solution”, Journal of Crystal Growth, 1996, pp. 285-294, vol. 163, Elsevier Science B.V.
Kelly, M. et al., “Optical Patterning of GaN Films”, Applied Physics Letters, Sep. 1996, pp. 1749-1751, vol. 69, No. 12, American Institute of Physics.
Kuramata, A. et al., “Substrate for III-V Group Nitride Semiconductors”, Oyo But

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