Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-10-20
2009-02-10
Garber, Charles D. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07488636
ABSTRACT:
A broken trim die tool detection sensor. The lands of the tie bar die connect with the leads of the unit to form switches. The states of these switches indicate broken die lands or other malfunctions.
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Azcarate Ronald B.
Foronda, Jr. Jong A.
Rosete Alwin A.
Brady III Wade J.
Garber Charles D.
Stevenson Andre′ C
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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