Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-09-23
2008-09-23
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000, C714S726000, C714S729000
Reexamination Certificate
active
10654972
ABSTRACT:
A boundary-scan device in which a plurality of signal paths are connected to the macro, each having a data signal input end and a data signal output end for signal transmission during normal mode operations. A plurality of circuits is provided for the plurality of signal paths, respectively. Each circuit is capable of capturing a signal transmission event that a signal has past through one of the plurality of signal paths during test mode operations.
REFERENCES:
patent: 6092226 (2000-07-01), Kramer et al.
patent: 6973609 (2005-12-01), Hong
patent: 2003/0149924 (2003-08-01), Bedal et al.
patent: 1438492 (2003-08-01), None
patent: H01-110275 (1989-04-01), None
patent: 3-4186 (1991-01-01), None
patent: H06-186308 (1994-07-01), None
patent: 10-197603 (1998-07-01), None
patent: 10-326301 (1998-12-01), None
patent: 11-101859 (1999-04-01), None
patent: 11-258304 (1999-09-01), None
patent: 11-326460 (1999-11-01), None
patent: 2001-142736 (2001-05-01), None
Chung Phung M
NEC Electronics Corporation
LandOfFree
Boundary scan device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Boundary scan device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Boundary scan device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3946030