Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating
Patent
1985-05-09
1986-04-15
Niebling, John F.
Chemistry: electrical and wave energy
Processes and products
Vacuum arc discharge coating
156643, 156646, 156657, 156662, 204192EC, 252 791, 252372, C03C 1500, C23C 1500
Patent
active
045825815
ABSTRACT:
BF.sub.3 based mixtures for selectively etching thin layers of silicon dioxide over silicon for use in the plasma etch process for integrated circuits manufacture is disclosed.
In the process, when trace amounts of formaldehyde are added to the etch system the rate on oxide inceases markedly. The effect on the silicon is not substantial. The optional addition of an inert diluent gas did not substantially change these results.
REFERENCES:
patent: 3246949 (1966-04-01), Olstowski
patent: 3679502 (1972-07-01), Hays
patent: 3880684 (1975-04-01), Abe
patent: 3923568 (1975-12-01), Bersin
patent: 3940506 (1976-02-01), Heinecke
patent: 3971684 (1976-07-01), Muto
patent: 3994793 (1976-11-01), Harvilchuck et al.
patent: 4017548 (1977-04-01), Petrille
patent: 4026742 (1977-05-01), Fujino
patent: 4052251 (1977-10-01), Weitzel
patent: 4069096 (1978-01-01), Reinberg et al.
patent: 4094732 (1978-06-01), Reinberg
patent: 4214946 (1980-07-01), Forget et al.
patent: 4263467 (1981-04-01), Madgavkar et al.
patent: 4283249 (1981-09-01), Ephrath
patent: 4310380 (1982-01-01), Flamm et al.
patent: 4314875 (1982-02-01), Flamm
patent: 4324611 (1982-04-01), Vogel et al.
patent: 4330384 (1982-05-01), Okudaira et al.
patent: 4364793 (1982-12-01), Graves
patent: 4381967 (1983-05-01), Sanders et al.
patent: 4405406 (1983-10-01), Casey et al.
patent: 4442338 (1984-04-01), Yamazaki
patent: 4450042 (1984-05-01), Purdes
patent: 4465552 (1984-09-01), Bobbio et al.
patent: 4473435 (1984-10-01), Zafiropoulo et al.
patent: 4479850 (1984-10-01), Beinvogl et al.
Aycock Robert F.
Bobbio Stephen M.
DePrenda Ralph L.
Flanigan Marie C.
Thrun Kenneth M.
Allied Corporation
Friedenson Jay P.
Nguyen Nam X.
Niebling John F.
Plantamura Arthur J.
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