Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Configuration or pattern of bonds
Reexamination Certificate
2007-03-27
2007-03-27
Richards, N. Drew (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Configuration or pattern of bonds
C257SE23050
Reexamination Certificate
active
11058392
ABSTRACT:
An integrated circuit chip is provided, which includes a bond pad structure. The bond pad structure includes a bond pad, a first metal plate, and a second metal plate. The first metal plate is located under the bond pad. The first metal plate has a first outer profile area. The second metal plate is located under the first metal plate. A cumulative top view outer profile area of the first metal plate and the second metal plate is larger than the first outer profile area of the first metal plate. The second metal plate may have a second outer profile area that is substantially equal to or larger than the first outer profile area. A first vertical axis may extend through a centroid of the first metal plate, and a centroid of the second metal plate may be laterally offset relative to the first vertical axis.
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Karimy Mohammad Timor
Richards N. Drew
Slater & Matsil L.L.P.
Taiwan Semiconductor Manufacturing Company , Ltd.
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