Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate
2011-01-07
2011-11-01
Pham, Ly D (Department: 2827)
Static information storage and retrieval
Read/write circuit
Flip-flop used for sensing
C365S063000, C365S072000, C365S202000, C365S203000, C365S207000
Reexamination Certificate
active
08050125
ABSTRACT:
In an embodiment, a bit line sense amplifier of a semiconductor memory device with an open bit line structure includes sense amplifier blocks, first voltage drivers, and a second voltage driver. The sense amplifier blocks include a first sense amplifier and a second sense amplifier, each sensing and amplifying a signal difference between a bit line and a complementary bit line. The first voltage drivers apply a power source voltage to the first sense amplifier, and the second voltage driver applies a ground voltage to the second sense amplifier. The first voltage drivers are disposed for every two or more sense amplifier blocks in a bit line sense amplifier region in which the sense amplifier blocks are arranged, and the second voltage driver is disposed in a conjunction region in which a control circuit is located to control the sense amplifier blocks. Both capacitive noise and device size are minimized.
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Kim Su-Yeon
Yang Hyang-Ja
Pham Ly D
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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