Bird's beak-less or STI-less OTP EPROM

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S296000

Reexamination Certificate

active

07045425

ABSTRACT:
The present invention facilitates semiconductor fabrication by maintaining uniform thickness of a gate oxide layer (112) during the oxide growth process of non-volatile memory devices (100). The uniform thickness of a gate oxide layer (112) is obtained by defining the boundaries of the source and drain areas (110) of a memory device (100) with the source/drain dopant masking and implanting operation. If an isolation barrier (108) is present it is kept a minimum safe distance (130) away from the periphery of the conductive gate layer (114) to avoid birds-beak regions (30) responsible for non-uniform gate oxide growth. As a result, the corresponding charge losses and weak cells are mitigated, thereby facilitating the fabrication of more reliable memory cells (100). Because a more uniform gate oxide thickness (112) is used in association with the memory cells (100), a single significantly thinner gate oxide layer (114) may be employed throughout the memory device (100). In this way, the same gate oxide layer (114) may be used by an NVM device (100) embedded with common CMOS devices to reduce wafer manufacturing costs.

REFERENCES:
patent: 5394101 (1995-02-01), Mitros
patent: 6222227 (2001-04-01), Chen
patent: 6313011 (2001-11-01), Nouri
patent: 6597026 (2003-07-01), Ogura
patent: 6667224 (2003-12-01), Watt et al.

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