Binary chlorofluorocarbon chemistry for plasma etching

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156646, 156656, 1566591, 156664, 252 791, C23F 102, C23F 112

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active

048368865

ABSTRACT:
A plasma comprised of trifluorochloromethane and an oxidant etches non-insulating materials such as tungsten at very high etch rates when the oxidant comprises at least 50% of the plasma by volume.

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Coburn et al., "Plasma Etching--A Discussion of Mechanisms", J. Vac. Sci. Tech., vol. 16, No. 2, Mar. Apr. 1979, pp. 391-403.
Coburn, "Plasma-Assisted Etching", Plasma Chemistry and Plasma Processing, vol. 2, No. 1, 1982, pp. 1-41.
"Blanket CVD Tungsten Interconnect for VLSI Devices," S. Mehta et al., 1986 Proceedings 3rd International IEEE VLSI Multilevel Interconnection Conference, Santa Clara, Calif., Jun. 9-10, 1986, pp. 418-435.
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