Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1987-11-23
1989-06-06
Lacey, David L.
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156646, 156656, 1566591, 156664, 252 791, C23F 102, C23F 112
Patent
active
048368865
ABSTRACT:
A plasma comprised of trifluorochloromethane and an oxidant etches non-insulating materials such as tungsten at very high etch rates when the oxidant comprises at least 50% of the plasma by volume.
REFERENCES:
patent: Re30505 (1981-02-01), Jacob
patent: 3923568 (1975-12-01), Bersin
patent: 3951709 (1976-04-01), Jacob
patent: 4026742 (1977-05-01), Fujino
patent: 4180432 (1979-12-01), Clark
patent: 4267013 (1981-05-01), Iida et al.
patent: 4314875 (1982-02-01), Flamm
patent: 4353777 (1982-10-01), Jacob
patent: 4374698 (1983-02-01), Sanders et al.
patent: 4473436 (1984-09-01), Beinvogl
patent: 4475982 (1984-10-01), Lai et al.
patent: 4547261 (1985-10-01), Maa et al.
patent: 4720322 (1988-01-01), Tiffin
Coburn et al., "Plasma Etching--A Discussion of Mechanisms", J. Vac. Sci. Tech., vol. 16, No. 2, Mar. Apr. 1979, pp. 391-403.
Coburn, "Plasma-Assisted Etching", Plasma Chemistry and Plasma Processing, vol. 2, No. 1, 1982, pp. 1-41.
"Blanket CVD Tungsten Interconnect for VLSI Devices," S. Mehta et al., 1986 Proceedings 3rd International IEEE VLSI Multilevel Interconnection Conference, Santa Clara, Calif., Jun. 9-10, 1986, pp. 418-435.
"RF Sputter-Etching by Fluoro-Chloro-Hydrocarbon Gases," N. Hosokawa et al., Japan J. Appl. Phys., Suppl. 2, Pt. 1, 1974, p. 435.
"Selective Dry Etching of Tungsten for VLSI Metallization," M. E. Burba et al., Journal of the Electrochemical Society: Solid State Science and Technology, Oct. 1986, pp. 2113-2118.
Anderson Andrew J.
Chadurjian Mark F.
International Business Machines - Corporation
Lacey David L.
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