Bent gate transistor modeling

Details Bent gate transistor modeling Bent gate transistor modeling

2005-03-22

2005-03-22

Smith, Matthew (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

06871333

ABSTRACT:
A method of characterizing a total width and an overall effective length for a bent gate. The bent gate is divided into logical portions, and each of the logical portions is designated as one of a bent portion, a corner portion, and a straight portion. A corner portion gate width and a corner portion effective length are computed for each of the logical portions designated as a corner portion. Similarly, a bent portion gate width and a bent portion effective length are computed for each of the logical portions designated as a bent portion. Likewise, a straight portion gate width and a straight portion effective length are computed for each of the logical portions designated as a straight portion. The total width of the bent gate is computed from the corner portion gate width, the bent portion gate width, and the straight portion gate width. Similarly, the overall effective length of the bent gate is computed from the corner portion effective length, the bent portion effective length, and the straight portion effective length.

REFERENCES:
patent: 6166560 (2000-12-01), Ogura et al.
patent: 6204542 (2001-03-01), Kinoshita et al.
patent: 6249900 (2001-06-01), Kotani et al.
patent: 6713793 (2004-03-01), Suzuki et al.
patent: 20030226128 (2003-12-01), Arai et al.

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