4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

SangJune Park

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Bent gate transistor modeling

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Reliability circuit for applying an AC stress signal or DC...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2848418

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