Back-bias voltage generator with temperature control

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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C365S189090, C365S222000

Reexamination Certificate

active

07009904

ABSTRACT:
Methods and apparatus for varying one or more internally generated voltages of a memory device based on the temperature of the memory device are provided. The device temperature may be measured directly, for example, via an on-chip temperature sensor, or may be supplied as bits in a mode register containing temperature information.

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Invitation to Pay Additional Fees / Results of the Partial International Search dated Mar. 31, 2005.

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