Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2006-03-07
2006-03-07
Lam, David (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S189090, C365S222000
Reexamination Certificate
active
07009904
ABSTRACT:
Methods and apparatus for varying one or more internally generated voltages of a memory device based on the temperature of the memory device are provided. The device temperature may be measured directly, for example, via an on-chip temperature sensor, or may be supplied as bits in a mode register containing temperature information.
REFERENCES:
patent: 5276843 (1994-01-01), Tillinghast et al.
patent: 5440520 (1995-08-01), Schutz et al.
patent: 5608347 (1997-03-01), Kearney
patent: 6002627 (1999-12-01), Chevallier
patent: 6005434 (1999-12-01), Tsukikawa et al.
patent: 6084812 (2000-07-01), Joo
patent: 6205074 (2001-03-01), Van Buskirk et al.
patent: 6343044 (2002-01-01), Hsu et al.
patent: 6456555 (2002-09-01), Sim et al.
patent: 6738297 (2004-05-01), Di Iorio
patent: 6768693 (2004-07-01), Feurle et al.
patent: 6778453 (2004-08-01), Martin et al.
patent: 6781907 (2004-08-01), Marr
patent: 6809978 (2004-10-01), Alexander et al.
patent: 6903994 (2005-06-01), Schoenfeld
patent: 2005/0105367 (2005-05-01), Kim et al.
Invitation to Pay Additional Fees / Results of the Partial International Search dated Mar. 31, 2005.
Lam David
Patterson & Sheridan, L.L.P
LandOfFree
Back-bias voltage generator with temperature control does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Back-bias voltage generator with temperature control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Back-bias voltage generator with temperature control will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3606614