Automated nanoassembly

Radiant energy – Inspection of solids or liquids by charged particles

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S307000, C073S105000

Reexamination Certificate

active

11205201

ABSTRACT:
An automated nanomanipulation system is provided for manufacturing a nanoscale structure. The system includes: a design model for the nanoscale structure; image data of a sample surface upon which the nanoscale structure is to be manufactured; a movable member configured to perform a nanomanipulation operation on the sample surface; and a path planning subsystem adapted to receive the design model and the image data. The path planning subsystem generates path data indicative of a path for traversing the movable member along the sample surface such that the movable member manipulates one or more randomly distributed nanoobjects in accordance with the design model.

REFERENCES:
patent: 6862921 (2005-03-01), Chand et al.
patent: 6862924 (2005-03-01), Xi et al.
Ahn, S. J. et al., “AFM nanolithography on a mixed LB film of hexadecylamine and palmitic acid,” Ultramicroscopy, vol. 91, pp. 171-176, 2002.
Avouris, P. et al, “Atomic force microscope tip-induced local oxidation of silicon: kinetics, mechanism, and nanofabrication,” Applied Physics Letters, vol. 71, pp. 285-287, 1997.
Chen, H. et al., “A General Framework for CAD-Guided Optimal Tool Planning for Free-Form Surfaces in Surface Manufacturing,” Journal of Manufacturing Science and Engineering, Feb. 2005.
Dubois, E. et al., “Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy,” Solid-State Electronics, vol. 43, pp. 1085-1089, 1999.
Guthold, M. et al., “Controlled Manipulation of Molecular Samples with the nanoManipulator,” IEEE/ASME Transactions on Mechatronics, vol. 5, No. 2, pp. 189-198, Jun. 2000.
Hansen, L. T. et al., “A technique for positioning nanoparticles using an atomic force microscope,” Nanotechnology, vol. 9, pp. 337-342, 1998.
Junno, T. et al., “Controlled manipulation of nanoparticles with an atomic force microscope,” Applied Physics Letters, vol. 66, No. 26, pp. 3627-3629, Jun. 1995.
Li, G. Y. et al., “3-D Nanomanipulation Using Atomic Force Microscopy,” in Proc. IEEE Int. Conf. Robotics and Automation, Taipei, Taiwan, pp. 3642-3647, Sep. 2003.
Li. G. Y. et al., “Assembly of Nanostructure Using AFM Based Nanomanipulation System,” in Proc. IEEE Int. Conf. Robotics and Automation, New Orleans, LA, Apr. 2004, pp. 428-433.
Li, G. Y. et al., “Development of Augmented Reality System for AFM-Based Nanomanipulation,” IEEE/ASME Transactions on Mechatronics, vol. 9, No. 2, pp. 358-365, Jun. 2004.
Makaliwe, J. H. et al., “Automatic Planning of Nanoparticle Assembly Tasks,” in Proc. IEEE Int'l Symp. on Assembly and Task Planning, Fukuoka, Japan, May 2001, 3pp.
Mokaberi, B. et al., “Towards Automatic Nanomanipulation: Drift Compensation in Scanning Probe Microscopes,” in IEEE Int'l Conf. Robotics and Automation, New Orleans, LA, Apr. 2004, 6pp.
Sitti, M. et al., “Tele-Nanorobotics Using Atomic Force Microscope,” in Proc. IEEE Int. Conf. Intelligent Robots and Systems, Victoria, B. C., Canada, Oct. 1998, pp. 1739-1746.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Automated nanoassembly does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automated nanoassembly, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automated nanoassembly will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3856858

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.