Autofocus method and apparatus for electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Methods

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250311, 250397, H01J 3726

Patent

active

050846183

ABSTRACT:
Autofocus method and apparatus capable of quickly detecting the focal point in an electron microscope in spite of the magnetic aftereffects of the ferromagnetic substance forming the objective lens. The autofocus method is initiated by causing the electron beam emitted from the microscope to hit a specimen at a first angle. Under this condition, the excitation current fed to the objective lens is continuously varied between values. At the same time, a video signal obtained from the resulting projected image is sampled at fixed intervals to obtain a first set of data. Then, the beam is caused to hit the specimen at a second angle. Under this condition, the excitation current fed to the objective lens is continuously varied between values. Simultaneously, a video signal produced from the resulting projected image is sampled at fixed intervals to obtain a second set of data. These two sets of data are compared to find the focal point.

REFERENCES:
patent: 3835403 (1974-09-01), Leimemann
patent: 4618766 (1986-10-01), van der Most et al.
patent: 4680469 (1987-07-01), Nomura et al.
patent: 4698503 (1987-10-01), Nomura et al.
patent: 4978856 (1990-12-01), Akado

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