Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2008-05-27
2008-05-27
Picardat, Kevin M. (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S142000, C438S149000
Reexamination Certificate
active
11414407
ABSTRACT:
The invention includes an atomic layer deposition method of forming a layer of a deposited composition on a substrate. The method includes positioning a semiconductor substrate within an atomic layer deposition chamber. On the substrate, an intermediate composition monolayer is formed, followed by a desired deposited composition from reaction with the intermediate composition, collectively from flowing multiple different composition deposition precursors to the substrate within the deposition chamber. A material adheres to a chamber internal component surface from such sequentially forming. After such sequentially forming, a reactive gas flows to the chamber which is different in composition from the multiple different deposition precursors and which is effective to react with such adhering material. After the reactive gas flowing, such sequentially forming is repeated. Further implementations are contemplated.
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Basceri Cem
Carlson Chris M.
Derderian Garo J.
Gealy F. Daniel
Sandhu Gurtej S.
Picardat Kevin M.
Prasad Neil
Wells St. John P.S.
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