Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate
2011-07-05
2011-07-05
Porta, David P (Department: 4177)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Atomic force microscopy or apparatus therefor, e.g., afm probes
C073S105000, C977S863000
Reexamination Certificate
active
07975316
ABSTRACT:
A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLRderived from a long-range interaction force and a ΔfSRderived from a short-range interaction force. Given this factor, a Δf curve on an atomic defect and a Δf curve on a target atom on the sample surface are each measured for only a relatively short range scale (S1and S2), and a difference Δf curve of those two curves is obtained (S3). Since the difference Δf curve is derived only from a short-range interaction force, a known conversion operation is applied to this curve obtain an F curve which illustrates the relationship between the force and the distance Z, and then the short-range interaction force on the target atom is obtained from the F curve (S4). Since the range scale in measuring the Δf curve can be narrowed, the measurement time can be shortened, and since the conversion from the Δf curve into F curve is required only once, the computational time can also be shortened. Consequently, in obtaining the short-range interaction force which acts between the atom on the sample surface and the probe, the time required for the Δf curve's measurement and the computational time are shortened, which leads to accuracy improvement and throughput enhancement.
REFERENCES:
patent: 5966053 (1999-10-01), Durig et al.
patent: 6605941 (2003-08-01), Abe
patent: 6768095 (2004-07-01), Niwa et al.
patent: 7400144 (2008-07-01), Tsuji et al.
patent: 7836757 (2010-11-01), Kitamura
patent: 2005/0212529 (2005-09-01), Huang et al.
patent: 2006-289542 (2006-10-01), None
M. A. Lantz, et al., “Site-specific force-distance characteristics on NaCI(001): Measurements versus atomistic simulations”, Physical Review B, 2006, pp. 245426-1 through 245426-9, vol. 74.
M. Abe, et al., “Room-temperature reproducible spatial force spectroscopy using atom-tracking technique”, Applied Physics Letters, 2005, pp. 173503-1 through 173503-3, vol. 87.
U. Dürig, “Extracting interaction forces and complementary observables in dynamic probe microscopy,” Applied Physics Letters, Feb. 2000, pp. 1203 through 1205, vol. 76, No. 9.
F. J. Giessibl, “A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy”, Applied Physics Letters, Jan. 2001, pp. 123 through 125, vol. 78, No. 1.
John E. Sader, et al. “Accurate formulas for interaction force and energy in frequency modulation force spectroscopy”, Applied Physics Letters, Mar. 2004, pp. 1801 through 1803, vol. 84, No. 10.
Noriaki Oyabu, et al., “Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy”, Physical Review Letters, Mar. 2006, pp. 106101-1 through 106101-4, vol. 96.
Yoshiaki Sugimoto, et al., “Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn/Si(111)-(√3x√3)R30° surface”, Physical Review B, 2006, pp. 205329-1 through 205329-9, vol. 73.
M. A. Lantz, et al., “Quantitative Measurement of Short-Range Chemical Bonding Forces”, Science, 2001, pp. 2580 through 2583, vol. 291.
Abe Masayuki
Custance Oscar
Morita Seizo
Ota Masahiro
Oyabu Noriaki
McCormack Jason
Osaka University
Porta David P
Shimadzu Corporation
Sughrue & Mion, PLLC
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