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- Scanning-probe techniques or apparatus; applications of scanning
- Particular type of scanning probe microscopy or microscope;...
- Atomic force microscopy or apparatus therefor, e.g., afm probes
Details
Oscar Custance
Oscar
Custance
- Patent Class
Scanning-probe techniques or apparatus; applications of scanning
- SubClass
Particular type of scanning probe microscopy or microscope;...
- SubSubClass
Atomic force microscopy or apparatus therefor, e.g., afm probes
- Specialty
Inventor
- Status
active
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Profile ID: LFUS-PAI-P-2276701
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