4. Radiant energy
  5. Inspection of solids or liquids by charged particles

Seizo Morita

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Atomic force microscope and interaction force measurement...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate

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Method for analyzing sample in liquid

Measuring and testing – Liquid analysis or analysis of the suspension of solids in a...
Reexamination Certificate

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Scanning probe microscope

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Scanning probe microscope having cantilever and detecting sample

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Scanning tunneling potentio-spectroscopic microscope and a data

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Profile ID: LFUS-PAI-P-288376

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