Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Diffusing a dopant
Reexamination Certificate
2005-03-08
2005-03-08
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Diffusing a dopant
C313S310000
Reexamination Certificate
active
06864162
ABSTRACT:
This invention provides novel methods of fabricating novel gated field emission structures that include aligned nanowire electron emitters (individually or in small groups) localized in central regions within gate apertures. It also provides novel devices using nanoscale emitters for microwave amplifiers, electron-beam lithography, field emission displays and x-ray sources. The new emission structures are particularly useful in the new devices.
REFERENCES:
patent: 6297063 (2001-10-01), Brown et al.
patent: 6465132 (2002-10-01), Jin
patent: 6538367 (2003-03-01), Choi et al.
patent: 6566704 (2003-05-01), Choi et al.
patent: 6664727 (2003-12-01), Nakamoto
patent: 6673392 (2004-01-01), Lee et al.
patent: 6741019 (2004-05-01), Filas et al.
Fourson George
Lowenstein & Sandler PC
Samsung Electronics Co,. Ltd.
Toledo Fernando L.
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