Apparatus, method and system for the treatment of a wafer

Drying and gas or vapor contact with solids – Process – With nondrying treating of material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C034S428000, C034S380000, C034S359000, C034S367000, C034S393000, C034S443000, C034S460000, C034S497000, C414S935000, C414S941000

Reexamination Certificate

active

06877250

ABSTRACT:
In an apparatus for a treatment of a wafer at elevated temperatures, the wafer is taken out of the reactor after heat treatment with the help of a mechanical transport apparatus which preferably grips the wafer around the circumference and on the under side. The transport apparatus includes a wafer surrounding ring. The wafer is placed in a floating wafer reactor where it is cooled in a controlled manner. Transport for further action or treatment then takes place.

REFERENCES:
patent: 4148575 (1979-04-01), Siryj
patent: 4622918 (1986-11-01), Bok
patent: 4860687 (1989-08-01), Frijlink
patent: 4987856 (1991-01-01), Hey et al.
patent: 4990047 (1991-02-01), Wagner et al.
patent: 5094013 (1992-03-01), Martin et al.
patent: 5241758 (1993-09-01), Cruz et al.
patent: 5281320 (1994-01-01), Turner et al.
patent: 5411076 (1995-05-01), Matsunaga et al.
patent: 5431700 (1995-07-01), Sloan
patent: 5855465 (1999-01-01), Boitnott et al.
patent: 5863170 (1999-01-01), Boitnott et al.
patent: 5911461 (1999-06-01), Sauter et al.
patent: 5974682 (1999-11-01), Akimoto
patent: 6068089 (2000-05-01), Brooks et al.
patent: 6097005 (2000-08-01), Akimoto
patent: 6111225 (2000-08-01), Ohkase et al.
patent: 6183565 (2001-02-01), Granneman et al.
patent: 6209220 (2001-04-01), Raaijmakers
patent: 6215106 (2001-04-01), Boas et al.
patent: 6285102 (2001-09-01), Matsuoka et al.
patent: 3608783 (1987-09-01), None
patent: 0 829 904 (1998-03-01), None
patent: 1012004 (2000-11-01), None
patent: WO 9013687 (1990-11-01), None
patent: WO 9801890 (1998-01-01), None
patent: WO 9836444 (1998-08-01), None
patent: WO 9903138 (1999-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus, method and system for the treatment of a wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus, method and system for the treatment of a wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus, method and system for the treatment of a wafer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3425180

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.