Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2007-08-15
2010-06-15
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C438S010000, C204S298030, C204S298080
Reexamination Certificate
active
07737702
ABSTRACT:
Wafer level arc detection is provided in a plasma reactor using an RF transient sensor sensing voltage at an electrostatic chucking electrode, the RF sensor being coupled to a threshold comparator, and a system controller responsive to the threshold comparator.
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Applied Materials Inc.
Dole Timothy J
Law Office of Robert M. Wallace
Zhu John
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