4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Ill Young Lee

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Apparatus and method for testing socket

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Apparatus for testing semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2139820

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