Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Patent
1985-09-25
1987-06-02
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Positive ion probe or microscope type
250281, H01J 37252
Patent
active
046706518
ABSTRACT:
An apparatus for the performance of the SNMS process, having a separate ion source, a sample holder, a system for the production of a radio-frequency plasma and a mass analyzer, in which the ion source and the mass analyzer are disposed side by side on the same side of the chamber provided for the radio-frequency plasma, and in which the sample mounted on the sample holder is situated within the chamber provided for the radio-frequency plasma. This apparatus can be used not only for the performance of the two kinds of SNMS operation (DMB and SBM) but also secondary ion mass spectroscopy (SIMS) under optimum spatial conditions.
REFERENCES:
patent: 4310759 (1982-01-01), Oechsner
patent: 4447724 (1984-05-01), Oechsner
Meier Stefan
Muller Karl-Heinz
Anderson Bruce C.
Berman Jack I.
Leybold-Heraeus GmbH
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