Apparatus for measuring feature widths on masks for the...

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

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C355S077000

Reexamination Certificate

active

10711424

ABSTRACT:
An apparatus for measuring feature widths on masks1for the semiconductor industry is disclosed. The apparatus encompasses a carrier plate16that is retained in vibrationally decoupled fashion in a base frame14; a scanning stage18, arranged on the carrier plate16, that carries a mask1to be measured, the mask1defining a surface4; and an objective2arranged opposite the mask1. A liquid25is provided between the objective2and the surface4of the mask1.

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patent: 2003/0053037 (2003-03-01), Blaesing-Bangert et al.
patent: 2004/0065517 (2004-04-01), Watson et al.
patent: 2005/0052642 (2005-03-01), Shibata et al.
patent: 2441336 (1976-03-01), None
patent: 206 607 (1984-02-01), None
patent: 221 563 (1985-04-01), None
patent: 101 40 174 (2003-03-01), None
patent: 56113115 (1981-09-01), None

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