Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1979-06-15
1981-10-27
Punter, William H.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356376, 356398, G01B 1124, G01B 1100
Patent
active
042970342
ABSTRACT:
An apparatus for measuring contour configuration of articles, particularly brittle articles such as ceramic honeycombs without touching them comprising a turn table on which the article to be measured is placed, a rotary encoder mechanically coupled to the turn table for producing a rotational angle signal representing a rotational position of the article on the turn table, a lamp for illuminating the article on the table, particularly a portion of article to be measured such as an upper edge or side edge, a pick-up device including a lens for forming an optical image of said portion of article and an image detector such as a linear array of image sensor for converting the optical image into a picture signal, a memory for storing a standard picture signal which will be produced by the image detector when a standard article having given dimensions placed on the turn table is scanned during a single rotation thereof, and an operation circuit for receiving the rotational angle signal from the rotary encoder, the picture signal from the pick-up device and the standard picture signal from the memory and comparing these picture signals under the control of the rotational angle signal to produce a deviation of contour configuration of the portion of article from the standard article.
REFERENCES:
patent: 3216311 (1965-11-01), Bibbero
patent: 3715165 (1973-02-01), Smith
patent: 4064534 (1977-12-01), Chen et al.
patent: 4122525 (1978-10-01), Eaton
Reich et al., "High-Speed Profile Measurement with Electro-Optics", Optical Engineering, vol. 15, 1,2-76, pp. 44-47.
Ito Isao
Tunashima Seiichi
NGK Insulators Ltd.
Punter William H.
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