Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1986-09-22
1988-07-12
Buczinski, Stephen C.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356373, 356375, 356385, 382 15, 382 48, G01B 1102, G01B 1114, G06K 920
Patent
active
047566213
ABSTRACT:
Apparatus for measuring a displacement of a movable member or a diameter of a cylindrical member comprises a photoelectric converting element array to convert light reflected by the surface of the member for producing an electric signal utilized to form a pattern information of the surface. The characterizing points of the pattern information are extracted and binarized into a binary pattern information which is compared with a reference pattern information. The difference between them is accumulated to determine the displacement. To measure a diameter the displacement thus obtained is divided by circular constant n.
REFERENCES:
patent: 3897156 (1975-07-01), Chasson
patent: 4199254 (1980-04-01), Kobayashi et al.
patent: 4309104 (1982-01-01), Prinz et al.
patent: 4312592 (1982-01-01), Sabater et al.
patent: 4637058 (1987-01-01), Ross et al.
patent: 4644584 (1987-02-01), Nagashima et al.
Buczinski Stephen C.
Toshiba Kikai Kabushiki Kaisha
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