Apparatus for inspecting a specimen

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

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Reexamination Certificate

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07049587

ABSTRACT:
Conventionally, defect data outputted by an inspection system comprised only characteristic quantitative data, such as coordinate data, area, and projected length, and only the coordinate data for moving to a defect location could be utilized effectively. By contrast, by using image data in addition to characteristic quantitative data as the defect data for an inspection system, the retrieval of image data via an outside results confirmation system is made possible. Further, for defect data of a plurality of substrates, it is possible to display a defect image during inspection by the fact that similar defects are retrieved via images and retrieval results are displayed as trends, which makes it possible to display a defect image during inspection by searching similar defects on images and displaying them as a trend, and designating a substrate on the trend, thereby displaying the defect map thereof and designating a defect on the defect map.

REFERENCES:
patent: 5761064 (1998-06-01), La et al.
patent: 5777327 (1998-07-01), Mizuno
patent: 6047083 (2000-04-01), Mizuno
patent: 6097887 (2000-08-01), Hardikar et al.
patent: 6476913 (2002-11-01), Machida et al.
patent: 6539106 (2003-03-01), Gallarda et al.
patent: 6919564 (2005-07-01), Nara et al.

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