Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-02-23
2008-12-23
Elms, Richard (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S148000, C365S149000
Reexamination Certificate
active
07468904
ABSTRACT:
A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.
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Lawson David C.
Ross Jason
BAE Systems Information and Electronic Systems Integration Inc.
Dillon & Yudell LLP
Elms Richard
Le Toan
Long Daniel J.
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