Apparatus for and methods of implanting desired chemical species

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region

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25049221, H01L 21425

Patent

active

060936258

ABSTRACT:
An apparatus and method for implanting a desired chemical species in a semiconductor substrate. The apparatus comprises a target chamber, a holder to hold a substrate in the target chamber for implantation, a pump to pump the target chamber down to a desired pressure, a pressure lock to enable a substrate to be passed into the target chamber for loading on the holder while the target chamber is at sub-atmospheric pressure, an ion beam generator for generating and directing a beam of ions containing said desired species at a surface of a substrate on said holder, and a reactive gas supply to feed a reactive gas into the target chamber while the chamber is maintained by the pump at the desired pressure, to provide a desired partial pressure of the reactive gas in the target chamber to reactive with and volatilise unwanted contaminants on surfaces in the target chamber.

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J. Deleu et al., "The behaviour of Si and CoSi.sub.2 during low energy nitrogen bombardment, with and without O.sub.2 -flooding, " Nuclear Instruments and Methods on Physics Research, B 113 (1996) pp. 537-538.

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