Apparatus and method for using a single bank of eFuses to...

Details Apparatus and method for using a single bank of eFuses to... Apparatus and method for using a single bank of eFuses to...

2008-05-13

2008-05-13

Louis-Jacques, Jacques (Department: 2112)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S711000, C714S726000

Reexamination Certificate

active

07373573

ABSTRACT:
An apparatus and method for using a single bank of electric fuses (eFuses) to successively store test data derived from multiple stages of testing are provided. To encode and store array redundancy data from each subsequent test in the same bank of eFuses, a latch on a scan chain is used that holds the programming information for each eFuse. This latch allows for programming only a portion of eFuses during each stage of testing. Moreover, the data programmed in the eFuses can be sensed and read as part of a scan chain. Thus, it can be easily determined what portions of the bank of eFuses have already been programmed by a previous stage of testing and where to start programming the next set of data into the bank of eFuses. As a result, the single bank of eFuses stores multiple sets of data from a plurality of test stages.

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