Apparatus and method for treating substrates

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

Reexamination Certificate

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C438S691000, C438S689000, C451S005000, C451S006000, C451S285000, C451S287000, C451S288000, C451S398000, C216S085000, C216S088000, C216S089000

Reexamination Certificate

active

11036865

ABSTRACT:
The present invention relates to a polishing apparatus for polishing a workpiece such as a semiconductor wafer to a flat mirror finish, and more particularly to a polishing apparatus having a workpiece transfer robot for transferring a workpiece from one operation to the next.The polishing apparatus according to the present invention comprises a polishing section including a top ring for holding a workpiece to be polished and a turntable having a polishing surface for polishing a surface of the workpiece held by the top ring; a cleaning section including a cleaning device for cleaning the workpiece that has been polished in the polishing section; and a workpiece transfer robot for transferring the workpiece to be polished to the polishing section or for transferring the workpiece that has been polished to the cleaning section. In this case, the workpiece transfer robot comprises a robot body; at least one arm operatively coupled to the robot body by at least one joint; a holder mechanism mounted on the arm for holding the workpiece; and a seal mechanism at the joint for preventing liquid from entering an interior of the joint, the seal mechanism.

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English language abstract of Korean Publication No. 2002-0093248.
English language abstract of Korean Publication No. 2003-0097413.
English language abstract of Korean Publication No. 2003-0063320.
English language abstract of Korean Application No. 2004-0049492.
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English language abstract of the Korean Publication No. 2002-0025834.

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