Apparatus and method for testing circuit units to be tested

Details Apparatus and method for testing circuit units to be tested Apparatus and method for testing circuit units to be tested

2007-06-05

2007-06-05

Decady, Albert (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S719000

Reexamination Certificate

active

10917176

ABSTRACT:
Apparatus and Method for Testing Circuit Units To Be Tested. According to one aspect, a test apparatus for testing circuit units to be tested, includes a nominal data production unit for production of a nominal data stream, a comparison device for comparison of an actual data stream which is emitted from the circuit unit to be tested as a function of the nominal data stream that is supplied with the nominal data stream; and a compression device for compression of an intermediate result signal which is emitted from the comparison device as a function of the comparison into a test result signal, with the intermediate result signal (108) which is emitted from the comparison device being temporarily stored in a buffer storage device with the intermediate result signal which is temporarily stored in a buffer storage device being read by means of a read unit.

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patent: 101 22 619 (2003-02-01), None
patent: 1061526 (2000-12-01), None

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