Apparatus and method for simulating and optimizing a chemical me

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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1566371, 156345, 216 88, 437225, H01L 2100

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active

055994237

ABSTRACT:
Apparatus and concomitant method for simulating a chemical mechanical polishing (CMP) system containing a polishing pad, a chuck for supporting a substrate, a positioner for positioning the polishing pad with respect to the substrate, a chuck rotator for rotating the chuck, and a polishing pad rotator for rotating the polishing pad. The CMP system simulation method comprises: defining polishing pad and substrate parameters; defining simulation parameters; determining, in response to said polishing pad, substrate and simulation parameters, a polishing result; and displaying the polishing result. Additionally, the simulation optimizes selected parameters to achieve a specified polishing non-uniformity across a substrate. Also, the simulation and optimization routines are interfaced to CMP system hardware to optimally control a substrate polishing process to achieve predetermined substrate polishing non-uniformity.

REFERENCES:
patent: 4793895 (1988-12-01), Kaanta et al.
patent: 4940507 (1990-07-01), Harbarger
patent: 5474644 (1995-12-01), Kato et al.
patent: 5514245 (1996-05-01), Doan et al.

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