Apparatus and method for self testing programmable logic arrays

Details Apparatus and method for self testing programmable logic arrays Apparatus and method for self testing programmable logic arrays

2005-03-29

2005-03-29

Tu, Christine T. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S735000

Reexamination Certificate

active

06874110

ABSTRACT:
A self-testing programmable logic array PLA system has an array of programmably interconnected logic cells, a built-in self-test (BIST) structure interconnected with the logic cells, and a BIST engine having an initiation input. The system is characterized in that, upon receiving the initiation input, the BIST engine drives the BIST structure to test connections and functions of the PLA. BIST systems are taught for stand-alone programmable logic arrays (PLAs) and for PLAs embedded in System-on-a-Chip (SoC) devices.

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