Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-02-08
2005-02-08
Chung, Phung M. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S819000, C365S201000, C365S230030
Reexamination Certificate
active
06854079
ABSTRACT:
An apparatus and a method are disclosed for reducing the pin driver count required for testing computer memory devices, specifically Rambus DRAM, while a die is on a semiconductor wafer. By reducing the pin count, more DRAMs can be tested at the same time, thereby reducing test cost and time. One preferred embodiment utilizes a trailing edge of a precharge clock to select a new active bank address, so that the address line required to select a new active address does not have to be accessed at the same time as the row lines.
REFERENCES:
patent: 5126973 (1992-06-01), Gallia et al.
patent: 5511029 (1996-04-01), Sawada et al.
patent: 5959929 (1999-09-01), Cowles et al.
patent: 6101139 (2000-08-01), Dean
patent: 6144598 (2000-11-01), Cooper et al.
patent: 6285962 (2001-09-01), Hunter
patent: 6314036 (2001-11-01), Cooper et al.
patent: 6530045 (2003-03-01), Cooper et al.
Rambus® Component Catalog, Copyright Mar. 1999 Rambus Inc., DL-0070-00, (26 pages).
Rambus® Technology Overview, Copyright Feb. 1999 Rambus Inc., DL-0040-00, (27 pages).
Rambus® Preliminary Information, Direct RDRAM 128/144-Mbit (256K×16/18×32s), Document DL0059, Version 0.9 (62 pages).
Ayres Scott L.
Brown David R.
Cooper Chris
Gatzemeier Scott N.
Giam Siang Tian
Chung Phung M.
Dooley Matthew C.
LandOfFree
Apparatus and method for reducing test resources in testing... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for reducing test resources in testing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for reducing test resources in testing... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3452073