4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Scott N. Gatzemeier

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Apparatus and method for parallel programming of antifuses

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Apparatus and method for reducing test resources in testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Apparatus and method for reducing test resources in testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Apparatus and method for reducing test resources in testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Independent polling for multi-page programming

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2819820

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