Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-01
2006-08-01
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S757020, C324S761010, C324S762010
Reexamination Certificate
active
07084650
ABSTRACT:
Methods and apparatuses for testing semiconductor devices are disclosed. Over travel stops limit over travel of a device to be tested with respect to probes of a probe card assembly. Feedback control techniques are employed to control relative movement of the device and the probe card assembly. A probe card assembly includes flexible base for absorbing excessive over travel of the device to be tested with respect to the probe card assembly.
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Cooper Timothy E.
Eldridge Benjamin N.
Reynolds Carl V.
Shenoy Ravindra Vaman
Burraston N. Kenneth
FormFactor Inc.
Tang Minh N.
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