4. Etching a substrate: processes
  5. Nongaseous phase etching of substrate
  6. Etching inorganic substrate

Ravindra Vaman Shenoy

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Apparatus and method for limiting over travel in a probe...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Metallic interconnect pad, and integrated circuit structure usin

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond
Patent

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Methods for monitoring components in the TiW etching bath...

Etching a substrate: processes – Nongaseous phase etching of substrate – With measuring – testing – or inspecting
Reexamination Certificate

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Selective chemical etching in microelectronics fabrication

Etching a substrate: processes – Nongaseous phase etching of substrate – Etching inorganic substrate
Patent

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Profile ID: LFUS-PAI-P-461894

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