Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-08-24
2008-09-16
Chaudry, Mujtaba (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C327S142000
Reexamination Certificate
active
07426667
ABSTRACT:
An apparatus for generating a function activation signal to activate a function in an integrated circuit device comprises a power-on circuit receiving a power input and initializing and generating a test activation signal, a test circuit receiving the test activation signal and generating a test result signal, and a threshold decision circuit receiving the test result signal and generating the function activation signal. The test circuit models a function of the integrated circuit device and generates the test result signal when the power input has reached a sufficient voltage to perform the function of the integrated circuit device. The threshold decision circuit generates the function activation signal if the test result signal indicates the power input has reached a sufficient voltage to perform the function of the integrated circuit device.
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Yasuda et. al., A Power On Reset Pulse Generator For Low Voltage Applications, 2001, IEEE, pp. iv-598-iv-601.
Chan Stephen
Huang Eddy
Sun Chung
Actel Corporation
Chaudry Mujtaba
Lewis and Roca LLP
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