Apparatus and method for identifying defective objects

Image analysis – Applications – Manufacturing or product inspection

Patent

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382145, G06K 900

Patent

active

059871610

ABSTRACT:
A device (10) identifies a defective object (12) from an image of the object (12) stored as pixel data in a pixel-data memory (52, 54, 56, 58). An inspection-point memory (72, 74, 76, 78) stores inspection-point data for the object (12). The inspection-point data represents inspection points (122, 124, . . . ) that are arranged in circuital (112, 136) and transverse (110) groups, where member inspection points of the circuital groups (112, 136) are also members of different ones of the transverse groups (110). A program memory (84) stores a program, which is executed by a processor (64, 66, 68, 70). The processor (64, 66, 68, 70) identifies which of the pixel data correspond to the inspection-point data, calculates differences between values of the corresponding pixel data within the circuital groups (112, 136), identifies a deviant pixel (116) if one of the differences exceeds a first threshold, calculates gradients of values of the corresponding pixel data within the transverse group (110a) including the deviant pixel and within at least one other transverse group (110b, 110c), and determines whether the gradients of the transverse group (110a) differs by more than a second threshold from the gradient of the other transverse group (10b, 10c).

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