Image analysis – Applications – Manufacturing or product inspection
Patent
1994-06-30
1999-11-16
Couso, Jose L.
Image analysis
Applications
Manufacturing or product inspection
382145, G06K 900
Patent
active
059871610
ABSTRACT:
A device (10) identifies a defective object (12) from an image of the object (12) stored as pixel data in a pixel-data memory (52, 54, 56, 58). An inspection-point memory (72, 74, 76, 78) stores inspection-point data for the object (12). The inspection-point data represents inspection points (122, 124, . . . ) that are arranged in circuital (112, 136) and transverse (110) groups, where member inspection points of the circuital groups (112, 136) are also members of different ones of the transverse groups (110). A program memory (84) stores a program, which is executed by a processor (64, 66, 68, 70). The processor (64, 66, 68, 70) identifies which of the pixel data correspond to the inspection-point data, calculates differences between values of the corresponding pixel data within the circuital groups (112, 136), identifies a deviant pixel (116) if one of the differences exceeds a first threshold, calculates gradients of values of the corresponding pixel data within the transverse group (110a) including the deviant pixel and within at least one other transverse group (110b, 110c), and determines whether the gradients of the transverse group (110a) differs by more than a second threshold from the gradient of the other transverse group (10b, 10c).
REFERENCES:
patent: 4532650 (1985-07-01), Wihl et al.
patent: 4608709 (1986-08-01), Hedler et al.
patent: 4794646 (1988-12-01), Takeuchi et al.
patent: 5095204 (1992-03-01), Novini
patent: 5214713 (1993-05-01), Juvinall
patent: 5305391 (1994-04-01), Gomibuchi
patent: 5369713 (1994-11-01), Schwartz et al.
patent: 5392359 (1995-02-01), Futamura et al.
Doane Dennis Lee
Doty Thomas J.
Harris Charles K.
Roy Rajiv
Woodall Joe Douglas
Brady III Wade James
Couso Jose L.
Do Anh Hong
Donaldson Richard L.
Stewart Alan K.
LandOfFree
Apparatus and method for identifying defective objects does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for identifying defective objects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for identifying defective objects will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1334561